High-precision analysis of 2D materials microstructures achieved using electron microscopy and machine learning

A research team led by NIMS has, for the first time, produced nanoscale images of two key features in an ultra-thin material: ...
Scientific Research Publishing

Parish, C., Batchelor, D., Progl, C. and Russell, P. (2007) Tutorial: Electron Beam-Induced Current in the Scanning Electron Microscope. Microscopy and Analysis, 21, 11-13.

ABSTRACT: In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques ...