Abstract: This paper proposes a novel test-nodes selection procedure for parametric fault diagnosis in analog circuit. In this procedure, one considers the impedance value as the most important ...
Abstract: To reveal the inner links between the circuits’ performance and the capacitor’s behavior of the ferroelectric random access memory (FRAM), the Landau-Khalatnikov (L-K) model and an EDA tool ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback