Abstract: This paper develops a degradation test scheme for insulated gate bipolar transistors (IGBTs) that are subjected to repeated electrostatic discharge (ESD). The proposed 7-step scheme is ...

Today’s high-speed PCB and system-level design demands fast, accurate simulation. This ebook explains how to choose the right ...

Hi, I'm Bill. I'm a software developer with a passion for making and electronics. I do a lot of things and here is where I ...

The new fabrication technique for all-2D transistors on flexible substrates offers a sustainable alternative, boosting ...

The hybrid model is emerging as the framework for trustworthy AI in test analytics. It retains traceability and supports ...

A research team affiliated with UNIST has uncovered a critical flaw in the performance evaluation metrics that have long ...

Miroslav Hancar] wasn’t satisfied with abusing just a single component for our Component Abuse Challenge. He decided to abuse ...

Littelfuse, Inc. announced the launch of two next-generation Tunneling Magnetoresistance (TMR) magnetic switches: the ...

Union Finance Minister Nirmala Sitharaman visited the upcoming facility of Tata Electronics' Outsourced Semiconductor ...