Ultrafast electron diffraction captures atomic layers twisting in response to light

A pulse of light sets the tempo in the material. Atoms in a crystalline sheet just a few atoms thick begin to move—not ...

High-precision analysis of 2D materials microstructures achieved using electron microscopy and machine learning

A research team led by NIMS has, for the first time, produced nanoscale images of two key features in an ultra-thin material: twist domains (areas where one atomic layer is slightly rotated relative ...
EE World Online

A practical guide to microcontroller structure and performance factors

Microcontroller units (MCUs) are single-chip computers optimized for performing embedded computing tasks like controlling a ...
Scientific Research Publishing

Parish, C., Batchelor, D., Progl, C. and Russell, P. (2007) Tutorial: Electron Beam-Induced Current in the Scanning Electron Microscope. Microscopy and Analysis, 21, 11-13.

ABSTRACT: In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques ...