AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

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AZOM

Lithium-Ion Battery Component Characterization via SEM, EDS and ToF-SIMS in FIB-SEM Tomography

A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
AZoNano

Nanofluidic Devices for DNA Optical Mapping can be Fabricated and Characterized with FIB-SEM

Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
AZOM

Plasma FIB-SEM platform for deep sectioning - TESCAN SOLARIS X

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Nature

Ultrastructurally smooth thick partitioning and volume stitching for large-scale connectomics

Today's scanning electron microscopes achieve ∼2-nm spot diameters at landing energies low enough that only the top few nanometers of the block's surface contributes substantially to the acquired ...