It is well established that transition and stuck-at fault models detect the vast majority of production defects. The transition fault model focuses on detecting timing-related defects. However, the ...

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...