This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...
In-circuit test (ICT) is a time-tested and proven method of testing PCBs. During ICT, a bed-of-nails fixture provides test-instrument access to PCB nodes. Each nail is positioned such that, when the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results