Pattern indexing is central to electron backscatter diffraction (EBSD) analysis. Creating an effective indexing algorithm was essential in the effort to automate EBSD. There are two steps to ...
Gain insights into 4D STEM orientation mapping with STEMx OIM, a tool that enhances workflow efficiency and accuracy in nanoscale materials characterization.
Recent advances in electron density analysis and X‐ray diffraction studies have dramatically refined our understanding of atomic and molecular structures. By employing cutting‐edge techniques that ...
Sponsored by Gatan, Inc.Reviewed by Olivia FrostFeb 21 2025 Pattern indexing is central to electron backscatter diffraction ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback