A non-parametric test for the bivariate c-sample problem is proposed. The test is an extension of a bivariate two-sample test given by Mardia (1967) and possesses various desirable properties. We ...
SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...
Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...
October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...
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