WIBW

Legislation to add greater transparency to classification processes introduced

TOPEKA, Kan. (WIBW) - Legislation that would streamline the process and add more transparency to systems of classification for government documents has been introduced in the U.S. Senate. Sen. Moran ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.